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2020 Intern - NVE PYE

Singapore, 01, SG

Relocation Level: No 

Hiring Manager: ROGER SEOW 

Recruiter: IVAN TAN 

 

Investigation of DRAM/NAND/NOR backend reliability and system testing fails

 

Project Scope

Selected candidate will work with a team of engineers to identify the root cause of major backend yield & reliability failures for NAND, DRAM, NOR through:
• Performing circuit analysis and electrical fault isolation through advanced bitmapping using in-house testers.
• Performing physical failure analysis on identified electrical fail locations to find the defect of interest.
• Identifying the relevant Fab process(es) which will lead to the formation of the defect of interest.
• Validate electrical/physical analysis results with data analysis of Fab related parameters.


We recruit, hire, train, promote, discipline and provide other conditions of employment without regard to a person's race, color, religion, sex, age, national origin, disability, sexual orientation, gender identity and expression, pregnancy, veteran’s status, or other classifications protected under law.  This includes providing reasonable accommodation for team members' disabilities or religious beliefs and practices.


Each manager, supervisor and team member is responsible for carrying out this policy. The EEO Administrator in Human Resources is responsible for administration of this policy. The administrator will monitor compliance and is available to answer any questions on EEO matters.


To request assistance with the application process, please contact Micron’s Human Resources Department at 1-800-336-8918 (or 208-368-4748).


Keywords:  Singapore || Central Singapore (SG-01) || Singapore (SG) || NVE (Non-Volatile Engineering Group) || Intern || Internship || Engineering || #LI-IT1 ||
 

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